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RIEGL will be Attending and Exhibiting at IAFSM 2020

By Eric Van Rees - 20th February 2020 - 07:02

RIEGL will be exhibiting and attending IAFSM 2020.

IAFSM (International Association of Forensic & Security Metrology) 2020 will take place from February 23-27, 2020 at the Inn at Opryland in Nashville, Tennessee.

RIEGL will be exhibiting in the McGavock AB section from February 23-28. Meet with our team of RIEGL experts during this conference to learn about the latest LiDAR sensor technology and discover how they can help you with your forensic needs.

On display will be the VZ-400i ultra high-performance 3D terrestrial laser scanner. This 3D laser scanning system combines an innovative new processing architecture, internet connectivity, and a suite of MEMS sensors with RIEGL’s latest waveform processing LiDAR technology.

Its ease of use, state-of-the-art hardware and software with one-touch workflows, and fully automatic data registration and colorization help to provide more complete, objective evidence gathering than ever before. The 3D point cloud output provides highly accurate, innovative and engaging ways to investigate or present evidence in court.

Don’t miss your opportunity to learn more about this system at IAFSM 2020!

Read More: Laser Scanning Education & Research

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